Electrochemical quartz crystal microbalance study of electrodeposition of copper-selenium thin films
Dang, Thi Bich Hop
Pham, Hong Quang
Do, Thi Kim Anh
Do, Phuc Quan
Ngo, Dinh Sang
Pham, Hong Quang
Do, Thi Kim Anh
Do, Phuc Quan
Ngo, Dinh Sang
The deposition of Copper-Selenium thin films was studied by using a
combination of Cyclic Voltammetry (CV) and Electrochemical Quartz
Crystal Microbalance (EQCM). The values of the equivalent atomic mass
(M/z) grown at the gold EQCM sensor during electrodeposition at varying
potentials and constant potentials were analyzed to understand the
mechanism of the growing process. The composition of the films
determined by EDS supports the assumption of the deposition process
which is based on the EQCM studies. The obtained results indicate the
role of sulfamic acid as a comlexing agent. The concentration of 20 mM
of sulfamic acid and the growing potential of - 0.9 V were found to be
the most suitable conditions for deposition of Copper-Selenium layers
towards CIGS thin film solar cell application.
Chi tiết xin mời tham khảo tại http://repository.vnu.edu.vn/handle/VNU_123/56229
| Title: | Electrochemical quartz crystal microbalance study of electrodeposition of copper-selenium thin films |
| Authors: | Dang, Thi Bich Hop Pham, Hong Quang Do, Thi Kim Anh Do, Phuc Quan Ngo, Dinh Sang |
| Keywords: | Electrochemical;electrodeposition;copper-selenium thin films |
| Issue Date: | 2013 |
| Publisher: | H. : ĐHQGHN |
| Series/Report no.: | Vol. 29;No. 2 (2013) |
| Description: | p. 25-32 |
| URI: | http://repository.vnu.edu.vn/handle/VNU_123/56229 |
| ISSN: | 2588-1124 |
| Appears in Collections: | Mathematics and Physics |
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